Volume 7, Issue 2 (2018)                   JCP 2018, 7(2): 125-133 | Back to browse issues page

XML Persian Abstract Print

Download citation:
BibTeX | RIS | EndNote | Medlars | ProCite | Reference Manager | RefWorks
Send citation to:

Cheraghi A, Shishehbor P, Kocheili F, Rasekh A, Jamshidnia A. Effects of egg age in Sesamia cretica (Lepidoptera: Noctuidae) on parasitism, development and reproduction of Telenomus busseolae (Hymenoptera: Platygastridae). JCP. 2018; 7 (2) :125-133
URL: http://jcp.modares.ac.ir/article-3-16908-en.html
1- Department of Plant Protection, Faculty of Agriculture, Shahid Chamran University of Ahvaz, Ahvaz, Iran.
2- Department of Entomology and Plant Pathology, Aburaihan Campus, University of Tehran, Tehran, Iran.
Abstract:   (3363 Views)
The sugarcane stem borer, Sesamia cretica Lederer, is one of the most economically important pests of sugarcane in Khuzestan province, southwest Iran. The egg parasitoid Telenomus busseolae Gahan significantly affect S. cretica population in the field. Host age is an important factor of host acceptance and suitability for egg parasitoids. We examined the ability of T. busseolae to parasitize and develop in S. cretica eggs of different ages. In a no choice laboratory experiment, we measured the effect of host age (12, 36, or 60h old) on parasitism rate and offspring fitness characteristics such as survival, development time, sex ratio, size, and progeny longevity and fecundity. Results revealed that the suitability of host eggs decreased as host age increased. Exposure of parasitoids to 12h old eggs resulted in higher percentage parasitism, higher acceptance, higher survival and larger body size of parasitoid progeny. Progeny that emerged from 12h old eggs had also higher longevity and fecundity than those emerged from other host ages tested.
Full-Text [PDF 333 kb]   (798 Downloads)    
Article Type: Full Paper | Subject: Acarology (Biological Control)
Received: 2017/11/6 | Published: 2018/07/15

Add your comments about this article : Your username or Email: